Laboratory of Surface engineering and applied surface science
Head of Laboratory:
Assoc Prof Dr Matjaž Godec
phone: +386 1 7401 900, firstname.lastname@example.org
The Laboratory for Surface Analysis is focused on the research and characterisation of solid surfaces, grain and phase boundaries, microstructure analysis, studies of physical and chemical phenomena on the free surfaces of metallic and inorganic materials (adsorption, segregation, oxidation, corrosion, wear, recrystallization, catalysis, thin- and ultra-thin-film analysis) with Auger electron spectroscopy (FE-AES), scanning Auger electron microscopy (SAM), X-ray photoelectron spectroscopy (XPS) and reflection electron-energy-loss spectroscopy (REELS). The laboratory can also perform studies of material structure at the atomic level with transmission electron microscopy (TEM).
- High-Resolution Auger-Electron Spectroscopy (HRAES),
- Scanning Auger-Electron Microscopy (SAM),
- Scanning Electron Microscopy (SEM),
- X-ray Photoelectron Spectroscopy (XPS),
- Reflected-Electron Energy-Loss Spectroscopy (REELS).
- research, development and optimization of the manufacturing of soft magnetic materials and electrical steel sheets,
- characterization of submicron carbide precipitates in steels and iron based alloys,
- investigation of the surfaces of metals covered by metallic or non-metallic films by means of "in-situ" analysis and measurements in ultra high vacuum at temperatures of up to 1000 °C,
- research into the interactions of the gas phase and the solid surface of materials,
- characterization of thin and ultra-thin films,
- characterization of surfaces after tribological testing,
- magnetic measurement of soft-magnetic materials.
VG-Scientific Microlab 310F with AES, SAM, SEM, XPS and in situ fracturing device
AES spectrum of four different chemical stages of titanium
- Microlab 310F VG-Scientific, a high-resolution field emission scanning spectrometer of Auger electrons (AES), scanning Auger electron microscopy (SAM), scanning electron microscopy (SEM), depth profiling, X-ray, photoelectron spectroscopy, (XPS) with "in situ" fracturing device, for research of phenomena of surface segregation and boundaries between grains and phases,
- Nikon optical microscope and equipment for the preparation of test specimens,
- Steingrover Remagraph RE for measuring magnetic field magnitude, magnetic induction, permeability, coercitivity and hysteresis losses,
- Tempres furnace for the simulation of industrial environments, in the temperature range from 400 to 1200 °C.
- MPI Max-Planck-Institut für Eisaenforschung, Düsseldorf, Germany,
- NIST – National Institute of Standards and Technology – Gaithersburg, ML, USA,
- Institut za fiziku, Sveuèilišta u Zagrebu, Zagreb, Hrvatska.