Research equipment

Transmission electron microscope JEM 2100 equipped with EDS and STEM

Dark field (DF) image of Ni₃Ti nano-precipitate
Dark field (DF) image of Ni3Ti nano-precipitate

HREM image of CuInSe₂ - (110)
HREM image of CuInSe2

Jeol SM09010 Cross section polisher
For cross section specific sample preparation
i.e soft coating on hard substrate (polymer on steel)

Jeol EM09100IS, ION SLICER
Device for preparation of sample for TEM

INSTRON 8801 dynamic tensile testing machine

Rockwell and Vickers hardness testers